Side- and end-viewing probes accommodate various mounting requirements. Specialty high-resolution probes allow the 279 to resolve spot diameters as small as 1 mm. Probes include air purge capability to prevent ingress of particulate.

Range:                         ±3000 volts, auto polarity

Accuracy:*                  0.1%, ±0.003%/°C over +20 to +40°C range (at recorder output) Useable to +50°C

Speed of Response:*

For typ. input step: <3ms (10% to 90%)

for 1kV step: <2½ms (10% to 90%)

for 2kV step: <3½ms (10% to 90%)

for 3kV step: <4ms (10% to 90%)

Settling time:                  <3½ms to 1% of 1kV step input

Frequency response:      Small signal frequency response typical ±3db to >300Hz

Drift:*                          <0.01V/hr after 1 hr warm-up (0.003V/hr typical). Not measureably affected by 10°C temperature variation or changes between 10% and 90% relative humidity.

Noise:*                        <0.3V rms or 2 volts peak-to-peak wide band (bandwidth restricted to <1kHz) referred to input.

Surface resolution:         Determined by probe aperture size and surface-probe separation. Standard type 1034E & S probes with 0.07” (1.75mm) aperture will resolve a     0.10” (2.5mm) spot at 0.02” (0.5mm) separation.

Recorder output:            Compressed analog output is input divided by 100, 200, or 1000 (factory selectable). Typical maximum dynamic range at isolated BNC     connector is > ±18 volts for external loads >10kΩ

Output filter:                 Bessel low pass filter with 0.7ms constant delay

Probe:                           Uses Model 1034 series probes

Power requirement:      100, 115, 230 VAC, ±10%, 50/60Hz, 15 watts

Size:                             1.7x8.2x15.1” (44x208x384mm), 1.75” rack mounting available (1 or 2 per rack)

Weight:                        4lb. (1.8kg)

Accessories:                Manual, probe hole vent plug, line cord, optional 220V fuses

CE Compliance:          Pending

• Electrophotographic measurements
• Radiation effect studies
• Electret research
• Electric field studies
• Process monitoring and control
• Integrated circuit manufacturing and handling